• Environmental Thermal Test Equipment for IC , PCB , Semiconductor Ceramic
  • Environmental Thermal Test Equipment for IC , PCB , Semiconductor Ceramic
  • Environmental Thermal Test Equipment for IC , PCB , Semiconductor Ceramic
Environmental Thermal Test Equipment for IC , PCB , Semiconductor Ceramic

Environmental Thermal Test Equipment for IC , PCB , Semiconductor Ceramic

Product Details:

Place of Origin: China
Brand Name: Haida
Certification: CE,SGS,ISO
Model Number: HD-E703

Payment & Shipping Terms:

Minimum Order Quantity: 1
Price: USD 10000--8000 Piece
Packaging Details: Strong Wooden Case
Delivery Time: 15 Days After Order
Payment Terms: L/C, T/T, D/A, D/P, Western Union, MoneyGram
Supply Ability: 75 Piece / Pieces Per Month
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Detail Information
Usage: High And Low Temperature Thermal Shock Test Chamber High Temp. Exposure Range*1: +60~ To +200°C
Low Temp. Exposure Range*1: -65to 0 °C Temp. Fluctuation *2: ±1.8°C
Pre-heat Upper Limit: +200°C Temp. Heat Up Time*3: Ambient Temp. To +200°C Within 30min
Pre-cool Lower Limit: -65°C Temp. Pull Down Time*3: Ambient Temp. To -65°C Within 70min
Temp. Recovery Time: Within 10 Min. External Material: Cold-rolled Rust-proofed Steel Plate
Test Area Material: SUS304 Stainless Steel Cooler: Stainless Steel Welded Plate Heat Exchanger
Air Circulator: Sirocco Fan Damper Driving Unit: Air Cylinder
Allowable Ambient Conditions: +5~30°C Power Supply: AC380V, 50/60Hz, Three Phase , 30A
Cooling Water Supply Pressure*6: 02~0.4Mpa Cooling Water Supply Rate*6: 8m³ /h
Operating Cooling Water Temp. Range: +18 To 23 °C Noise Level: 70 DB Or Lower
High Light:

Thermal Shock Tester

,

Thermal Aging Test

Product Description

Environmental Thermal Test Equipment for IC , PCB , Semiconductor Ceramic

 

 

1. Description:

High and Low Temperature Shock Simulate Test Chamber to test the changes in physical of the electronic chip IC, PCB, semiconductor ceramic and polymer materials. 
 

The machine is divided into three sections: the high temperature chamber, the low temperature chamber, and testing.

 

 

2. Specifications of High and Low Temperature Shock Simulate Test Chamber:

 

System

Two-zone test by means of damper switching

Three-zone chamber

Model

HD-E703-50A/HD-E703-50W

HD-E703-100A/HD-E703-100W

Customized

Performance

Test area

High temp. exposure range*1

+60~ to +200°C

Low temp. exposure range*1

-65to 0 °C

Temp. fluctuation *2

±1.8°C

Hot chamber

Pre-heat upper limit

+200°C

Temp. heat up time*3

Ambient temp. to +200°C within 30min

Cold chamber

Pre-cool lower limit

-65°C

Temp. pull down time*3

Ambient temp. to -65°C within 70min

Temp. recovery (2-zone)

Recovery conditions

Two-zone: High temp. exposure +125°C 30 min, Low temp. exposure -40°C 30 min; Specimen 6.5 kg (specimen basket 1.5kg) 

Temp. recovery time

Within 10 min.

Construction

External material

Cold-rolled rust-proofed steel plate

Test area material

SUS304 stainless steel

Door*4

Manually operated door with unlock button

Heater

Strip wire heater

Refrigeration unit

System*5

Mechanical cascade refrigeration system

Compressor

Hermetically sealed scroll compressor

Expansion mechanism

Electronic expansion valve

Refrigerant

High temp side:R404A, Low temp side R23

Cooler

Stainless steel welded plate heat exchanger

Air circulator

Sirocco fan

Damper driving unit

Air cylinder

Fittings

Cable port with diameter 100mm on the left side (right side and tailor made diameter size are available as options), specimen power supply control terminal

Inside dimensions (W x H x D)

350 x 400 x 350

500 x 450 x 450

Customized

Test area capacity

50L

100L

Customized

Test area load

5 kg

10 kg

Customized

Outside dimensions (W x H x D)

1230 x 1830 x 1270

1380 x 1980 x 1370

Customized

Weight

800kg

1100kg

N/A

 

Utility requirements

 

Allowable ambient conditions

+5~30°C

Power supply

AC380V, 50/60Hz, three phase , 30A

Cooling water supply pressure*6

02~0.4Mpa

Cooling water supply rate*6

8m³ /h

Operating cooling water temp. range

+18 to 23 °C

Noise Level

70 dB or lower
 
 

Notes

 

1. If the high-temp exposure range lower limit + 60°C is required or the low temp exposure range lower limit -60°C, please select the “ambient-temperature exposure” option

 

2. If the temp fluctuation need to below ±1.8°C please select the “Low temp fluctuation package”

 

3. Temperature heat-up/pull down time are applicable only during independent chamber operation

 

4. If the automatically operated sliding door required, please select the “Automatically door package”

 

5. Air-cooled condenser / Water-cooled condenser both available

 

6. Apply on water-cooled condenser only

 

 

3. Safety Devices of High and Low Temperature Shock Simulate Test Chamber:

  1. Hot chamber overheat protection switch
  2. Cold chamber overheat protection switch
  3. Air circulator overload alarm
  4. Refrigerator high/low pressure protector
  5. Compressor temperature switch
  6. Air pressure switch
  7. Fuse
  8. Water suspension relay ( water-cooled specification only)
  9. Compressor circuit breaker
  10. Heater circuit breaker
  11. Test area overheat/overcool protector
  12. Air purge valve

 

Control 

 

Environmental Thermal Test Equipment for IC , PCB , Semiconductor Ceramic 0

(Color LCD interactive touch-screen system)

 

Operation and settings simplified by the use of a touch-screen LCD display (instructions displayed on-screen). At-aglance confirmation of test patterns, test area temperatures, temperature cycles, and trend graph displays.

 

Setting

Interactive key input by touch panel

Display

LCD (5.7 inches)

Temperature control function

Test area: exposure temp.

Hot chamber: pre-heating temp.

Cold chamber: pre-cooling temp.

PID control

Preset temperature range

High temperature: 60 to200’C

Low temperature: -78 to 0’C

Setting resolution

1’C

Input

Thermocouple type T (Copper/Copper-Nickel)

Setting and indication ranges

Preset time: 0 min. to 99 hours and 59 min.

Preset cycle: 1 to 9,999 cycles

Accessory function

Timer preset

Overheat/ overcool protection

Power failure/ recovery selection

Temperature recovery time setting

Program memory

Automatic power shut-off

Programmed time display

Test completion mode selection

Trend graph

Alarm history display

Sensor calibration

RS-232/ USB communication
 

 

4. Environmental High and Low Temperature Shock Simulate Test Chamber view:

 

Environmental Thermal Test Equipment for IC , PCB , Semiconductor Ceramic 1

 

 

Environmental Thermal Test Equipment for IC , PCB , Semiconductor Ceramic 2

(The Test Chamber)

 

 

 

Tag:

pcb board testing equipment

circuit board testing equipment

material testing equipment

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